Analyzing and improving delay defect tolerance in pipelined combinational circuits

  • Authors:
  • D. Wessels;J. C. Muzio

  • Affiliations:
  • -;-

  • Venue:
  • DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
  • Year:
  • 1995

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Abstract

In this paper, we consider the problems of identification of delay-fault-sensitive components in a pipelined combinational circuit, and of circuit modification to improve the circuit's tolerance of delay faults. The results assume purely combinational logic, and fixed gate delays calculated under floating delay mode.