Optimal interconnect diagnosis of wiring networks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Sweeping Line Approach to Interconnect Testing
IEEE Transactions on Computers
A coloring approach to the structural diagnosis of interconnects
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
A New Diagnosis Approach for Short Faults in Interconnects
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Diagnosis of interconnects and FPICs using a structured walking-1 approach
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Testing for Faults in Wiring Networks
IEEE Transactions on Computers
| Hi-index | 0.00 |
This paper deals with the inverse problem (namely, diagnosability) for diagnosing bridge faults in interconnects. Given a test set (T) and the layout of an interconnect, the diagnosability problem consists of establishing the probability (coverage) of diagnosing (detection and/or location) all faults and to identify the undiagnosable faults (if any). It is proved that this process is equivalent of checking each edge in the adjacency graph representation of the layout using the tests in T (either parallel, or sequential test vectors). Different algorithms are given for diagnosis and detection.