ATPG versus Logic BIST -Now and in the Future

Authors:
Kenneth M. Butler
Affiliations:
-
Venue:
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Year:
2001

Citing 3
Cited 0

A case study on the implementation of the Illinois Scan Architecture

Proceedings of the IEEE International Test Conference 2001
THE PATH to ONE - PICOSECOND ACCURACY

ITC '00 Proceedings of the 2000 IEEE International Test Conference
REDUCING TEST DATA VOLUME USING EXTERNAL/LBIST HYBRID TEST PATTERNS

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Quantified Score

Hi-index	0.02

Visualization

Abstract