Memory fault diagnosis by syndrome compression
Proceedings of the conference on Design, automation and test in Europe
Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test
Journal of Electronic Testing: Theory and Applications
Semiconductor manufacturing process monitoring using built-in self-test for embedded memories
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Hi-index | 0.01 |
A unique lossless data compression algorithm has beenimplemented into a Bitmap Display Processor. ThisScanner hardware will allow massive non-lossycompression of Bitmap failure images on the order of10,000 to one. The capability should allow newopportunities for testing speed and qualities, with smallfile sizes and fast image updates.1