A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs
Journal of Electronic Testing: Theory and Applications
An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
False Error Vulnerability Study of On-line Soft Error Detection Mechanisms
Journal of Electronic Testing: Theory and Applications
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Robust circuit design techniques with respect to soft errors gain importance in the era of very deep submicron technologies. On-line testing will play an important role towards this direction. In this paper we propose a hierarchical architecture for concurrent soft error detection. This architecture is based on current sensing techniques and provides very low area overhead, small detection times and negligible performance penalty on the funtional circuit under check.