Dual Threshold Voltage Circuits in the Presence of Resistive Interconnects

  • Authors:
  • Per Larsson-Edefors;Daniel Eckerbert;Henrik Eriksson

  • Affiliations:
  • -;-;-

  • Venue:
  • ISVLSI '03 Proceedings of the IEEE Computer Society Annual Symposium on VLSI (ISVLSI'03)
  • Year:
  • 2003

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Abstract

We consider the power-optimal design of dual-VT CMOScircuits under challenging delay constraints, with thresholdvoltages and device sizes as design variables. We show thatthe presence of interconnect resistance affects the optimumchoices of VT and device sizes, and that ignoring the resistance can lead to highly suboptimal results. We also presentcriteria for deciding when interconnect resistance should betaken into account.