A functional-level test generation methodology using two-level representations

Authors:
U. J. Davé;J. H. Patel
Affiliations:
Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois;Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois
Venue:
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Year:
1989

Citing 2
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Abstract