Enabling Embedded Memory Diagnosis via Test Response Compression

Authors:
John T. Chen;Wojciech Maly;Janusz Rajski;Omar Kebichi;Jitendra Khare
Affiliations:
-;-;-;-;-
Venue:
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Year:
2001

Citing 0
Cited 2

Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

Journal of Electronic Testing: Theory and Applications
Test Response Compression and Bitmap Encoding for Embedded Memories in Manufacturing Process Monitoring

ITC '01 Proceedings of the 2001 IEEE International Test Conference

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Abstract

This paper introduces a method that enables failure diagnosis of BISTed memories by compression of test responses. This method has been tested by simulation of memories with various specifications, fail patterns and test algorithms. The proposed method has been implemented in 0.18 CMOS IC.