Test Response Compression and Bitmap Encoding for Embedded Memories in Manufacturing Process Monitoring

Authors:
John T. Chen;Jitendra Khare;Ken Walker;Saghir Shaikh;Janusz Rajski;Wojciech Maly
Affiliations:
-;-;-;-;-;-
Venue:
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Year:
2001

Citing 6
Cited 0

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Abstract

This paper introduces a method that enables the diagnosis ofembedded memories via test response compression and automaticbitmap recognition. The proposed method has beentested via simulation with various memory specifications,fail patterns and test algorithms; it has also been implementedin a 0.18 µm CMOS test chip.