Hierarchical analysis of process variation for mixed-signal systems
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Monte Carlo-Alternative Probabilistic Simulations for Analog Systems
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
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Increasing numbers of analog components in today's systems necessitate system level test composition methods that utilize on-chip capabilities rather than solely relying on costly DFT approaches. We outline a tolerance analysis methodology for test signal propagation to be utilized in hierarchical test generation for analog circuits. A detailed justification of this proposed novel tolerance analysis methodology is undertaken by comparing our results with detailed SPICE Monte-Carlo simulation data on several combinations of analog modules. The results of our experiments confirm the high accuracy and efficiency of the proposed tolerance analysis methodology.