RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems
Journal of Electronic Testing: Theory and Applications
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage
Journal of Electronic Testing: Theory and Applications
RTL-Based Functional Test Generation for High Defects Coverage in Digital SOCs
ETW '00 Proceedings of the IEEE European Test Workshop
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Hi-index | 0.00 |