Diagnosis of MRAM write disturbance fault
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Write disturbance modeling and testing for MRAM
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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The ITRS (International Technology Roadmap for Semiconductors) roadmap is updated on a yearly basis to forecast industry silicon trends. The ITRS Test Working Group (TWG) identifies the key trends that will have an impact on device test and summarizes them to provide direction to test suppliers. The commodity memory roadmap is a key part of that forecast and covers discrete and embedded DRAM and Flash. The material in this paper represents a very early look at the potential commodity memory roadmap due for release in November of 2003 and is based upon the 2002 roadmap.