Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead

Authors:
Vinu Vijay Kumar;John Lach
Affiliations:
-;-
Venue:
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Year:
2003

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Abstract

The continuous increase in digital system complexity is raising the area cost of redundancy-based fault and defect tolerance. This paper introduces a technique for heterogeneous redundancy in control path and datapath circuitry that provides high reliability with area overhead that is independent of system complexity. Small amounts of circuit-specificreconfigurable logic are finely integrated with fixed-logic circuitry to provide fine-grained heterogeneous fault and defect tolerance. Results reveal that the technique is effective for avariety of circuits, providing high reliability with a constant magnitude area overhead that isindependent of system complexity.