On mismatch in the deep sub-micron era - from physics to circuits

Authors:
Rasit Onur Topaloglu;Alex Orailoglu
Affiliations:
University of California at San Diego, La Jolla, CA;University of California at San Diego, La Jolla, CA
Venue:
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Year:
2004

Citing 2
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Abstract

Rapid decrease in feature sizes has increasingly accentuated the importance of matching between transistors. Deep sub-micron designs will further emphasize the need to focus on the effects of mismatch. Furthermore, increased efforts on high level analog device modeling will necessitate accompanying mismatch simulation and measurement methods. The deep sub-micron era forces circuit designers to learn more about the physics and the technology of transistors. This study introduces a method and assists circuit designers in including this method in their traditional design flow of circuits. By proposing a solution to the problem of building a modeling bridge between transistor mismatch and circuit response to it, we hope to enable designers to incorporate low level mismatch information in their higher level design.