Data Integrity Evaluations of Reed Solomon Codes for Storage Systems

Authors:
G. C. Cardarilli;M. Ottavi;S. Pontarelli;M. Re;A. Salsano
Affiliations:
University of Rome "Tor Vergata", Italy;University of Rome "Tor Vergata", Italy;University of Rome "Tor Vergata", Italy;University of Rome "Tor Vergata", Italy;University of Rome "Tor Vergata", Italy
Venue:
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Year:
2004

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Abstract

This paper introduces a very flexible approach for the evaluation of Bit Error Rate (BER) attainable on storage systems which use Reed Solomon codes. These evaluations are based on the use of a Markov model to evaluate the probabilities of having an uncorrectable codeword. Differently from previous literature, the reported approach can take into accountthe impact of both erasures and random errors allowing smaller degree of approximation and better evaluation of BER improvement related to the introduction of scrubbing techniques.The flexibility of the proposed method is finally shown by applying it to different cases of interest.