Error detection in ternary CAMs using bloom filters

Authors:
Salvatore Pontarelli;Marco Ottavi;Adrian Evans;Shi-Jie Wen
Affiliations:
University of Rome "Tor Vergata", Rome Italy;University of Rome "Tor Vergata", Rome Italy;iRoC Technologies, Grenoble, France;Cisco Systems Inc., San Jose, CA
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2013

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Abstract

This paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memories (TCAMs) based on the use of Bloom Filters. The proposed approach is described in detail and its performance results are presented. The advantages of the proposed method are that no modifications to the TCAM device are required, the checking is done on-line and the approach has low power and area overheads.