Jitter Measurements of High-Speed Serial Links

  • Authors:
  • Marcel A. Kossel;Martin L. Schmatz

  • Affiliations:
  • IBM Zurich Research Laboratory;IBM Zurich Research Laboratory

  • Venue:
  • IEEE Design & Test
  • Year:
  • 2004

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Abstract

Jitter is one of the most important issues in the design and operation of high-speed serial links. This article focuses on the BERT scan method, a jitter characterization method based on scanning the bit-error rate within the eye diagram.