Reducing Leakage with Mixed-V_th (MVT)

Authors:
Frank Sill;Frank Grassert;Dirk Timmermann
Affiliations:
University of Rostock;University of Rostock;University of Rostock
Venue:
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Year:
2005

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Abstract

We present a new method for assignment of devices with different V_th in a double-V_th-process, whereas leakage is reduced and performance increases or is constant. A mixed-V_th gate type is developed, which renders new masks unnecessary. As compared with known methods, our approach achieves an additional leakage reduction of 25% while leakage reduction in raw designs is average 65%.