Design of Nonlinear CA Based TPG Without Prohibited Pattern Set In Linear Time

Authors:
Sukanta Das;Anirban Kundu;Biplab K. Sikdar;P. Pal Chaudhuri
Affiliations:
Department of Information Technology, Bengal Engineering College (DU), India 711103;Department of Computer Science & Technology, Bengal Engineering College (DU), India 711103;Department of Computer Science & Technology, Bengal Engineering College (DU), India 711103;Aff3, Kolkata, India 700094
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2005

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Abstract

In order to prevent ground bounce, Automatic Test Pattern Generation (ATPG) algorithms for wire interconnects have recently been extended with the capability to restrict the maximal Hamming distance between any two consecutive test patterns to a user-defined ...