Analysis and Optimization of Static Power Considering Transition Dependency of Leakage Current in VLSI Circuits

Authors:
Afshin Abdollahi;Farzan Fallah;Massoud Pedram
Affiliations:
University of Southern California;Fujitsu Labs of America;University of Southern California
Venue:
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Year:
2005

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Abstract

We show that leakage current in VLSI circuits is not only a function of the current state (input combination) of a combinational circuit but also is dependent on the state history (previous input combinations.) As an example application of the transition-dependent leakage model, we extend a known technique for calculating and applying the minimum leakage input vector to a combinational circuit in the standby mode to one which calculates and applies a pair of input vectors to initialize the circuit to the minimum leakage configuration.