Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs

Authors:
Carsten Wegener;Michael Peter Kennedy
Affiliations:
Department of Microelectronic Engineering, University College Cork, Ireland;Department of Microelectronic Engineering, University College Cork, Ireland
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2005

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Abstract

Test setup limitations, such as noise and parasitics, increasingly impede repeatable and accurate linearity measurements in high-volume production testing of high-precision data converters. Model-based testing has been shown to reduce the adverse effects of noise [14].In this work, we present two enhancements of the linear model-based approach: one is a change of the modeling strategy in order to account for measurement errors induced, for example, by parasitics associated with the device contactor, and another is a Design-for-Test feature that significantly improves the model's ability to reduce the effect of measurement noise on the accuracy of the test outcome.