Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs
Journal of Electronic Testing: Theory and Applications
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays
Journal of Electronic Testing: Theory and Applications
Test Development Through Defect and Test Escape Level Estimation for Data Converters
Journal of Electronic Testing: Theory and Applications
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
Journal of Electronic Testing: Theory and Applications
Is IDDQ yield loss inevitable?
ITC'94 Proceedings of the 1994 international conference on Test
Calculating error of measurement on high speed microprocessor test
ITC'94 Proceedings of the 1994 international conference on Test
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