Built-In-Self-Testing Techniques for Programmable Capacitor Arrays

Authors:
Amit Laknaur;Sai Raghuram Durbha;Haibo Wang
Affiliations:
Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, USA 62901-6603;Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, USA 62901-6603;Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, USA 62901-6603
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2006

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Abstract

Sigma---Delta (驴驴) modulators have made possible the design of high-resolution Analogue-to-Digital Converters (ADCs) with relaxed analogue circuitry precision by moving most of the design complexity to the digital domain. However, testing these 驴驴 ADCs ...