Automatic measurement of memory hierarchy parameters

  • Authors:
  • Kamen Yotov;Keshav Pingali;Paul Stodghill

  • Affiliations:
  • Cornell University, Ithaca, NY;Cornell University, Ithaca, NY;Cornell University, Ithaca, NY

  • Venue:
  • SIGMETRICS '05 Proceedings of the 2005 ACM SIGMETRICS international conference on Measurement and modeling of computer systems
  • Year:
  • 2005

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Abstract

The running time of many applications is dominated by the cost of memory operations. To optimize such applications for a given platform, it is necessary to have a detailed knowledge of the memory hierarchy parameters of that platform. In practice, this information is poorly documented if at all. Moreover, there is growing interest in self-tuning, autonomic software systems that can optimize themselves for different platforms; these systems must determine memory hierarchy parameters automatically without human intervention.One solution is to use micro-benchmarks to determine the parameters of the memory hierarchy. In this paper, we argue that existing micro-benchmarks are inadequate, and present novel micro-benchmarks for determining parameters of all levels of the memory hierarchy, including registers, all data caches and the translation look-aside buffer. We have implemented these micro-benchmarks in a tool called X-Ray that can be ported easily to new platforms. We present experimental results that show that X-Ray successfully determines memory hierarchy parameters on current platforms, and compare its accuracy with that of existing tools.