Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST

  • Authors:

  • Peter Wohl;John A. Waicukauski;Sanjay Patel;Cy Hay;Emil Gizdarski;Ben Mathew

  • Affiliations:

  • Synopsys Inc.;Synopsys Inc.;Synopsys Inc.;Synopsys Inc.;Synopsys Inc.;Synopsys Inc.

  • Venue:
  • VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
  • Year:
  • 2005

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Abstract

Scan-based tests created by automatic test pattern generators (ATPG) can be efficiently compressed and applied in a deterministic built-in self-test (DBIST) architecture. However, the BIST environment adds significant complexity to failure diagnosis. We present a simple scan-compatible diagnosis solution 驴 streaming DBIST (SDBIST), which is based on a low-overhead hierarchical compactor. SDBIST allows continuously monitoring streaming scanout data for reduced-volume expect-data diagnosis, on-line fail-data collection and selective scan cell masking.