Energy efficient SEU-tolerance in DVS-enabled real-time systems through information redundancy

  • Authors:
  • Alireza Ejlali;Marcus T. Schmitz;Bashir M. Al-Hashimi;Seyed Ghassem Miremadi;Paul Rosinger

  • Affiliations:
  • Sharif University of Technology, Tehran, Iran;University of Southampton, United Kingdom;University of Southampton, United Kingdom;Sharif University of Technology, Tehran, Iran;University of Southampton, United Kingdom

  • Venue:
  • ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
  • Year:
  • 2005

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Abstract

Concerns about the reliability of real-time embedded systems that employ dynamic voltage scaling has recently been highlighted [1,2,3], focusing on transient-fault-tolerance techniques based on time-redundancy. In this paper we analyze the usage of information redundancy in DVS-enabled systems with the aim of improving both the system tolerance to transient faults as well as the energy consumption. We demonstrate through a case study that it is possible to achieve both higher fault-tolerance and less energy using a combination of information and time redundancy when compared with using time redundancy alone. This even holds despite the impact of the information redundancy hardware overhead and its associated switching activities