A Review of DASIE Code Family: Contribution to SEU/MBU Understanding

Authors:
G. Hubert;N. Buard;C. Weulersse;T. Carriere;M.-C. Palau;J.-M. Palau;D. Lambert;J. Baggio;F. Wrobel;F. Saigne;R. Gaillard
Affiliations:
EADS, Corporate Research Center;EADS, Corporate Research Center;EADS, Corporate Research Center;EADS, Space Transportation;EADS, Space Transportation;University of Montpellier;CEA/DAM;CEA/DAM;University of Nice;University of Montpellier;NFODUC
Venue:
IOLTS '05 Proceedings of the 11th IEEE International On-Line Testing Symposium
Year:
2005

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Abstract

DASIE (the Detailed Analysis of Secondary Ion Effect) is the name of a code family dedicated to the SEE rate prediction. This paper presents a review of DASIE code family and its contributions to SEU (Single Event Upset) and MBU (Multiple Bit Upset) understanding.