Reliable Digital Circuits Design using Sigma-Delta Modulated Signals

Authors:
Erik Schuler;Luigi Carro
Affiliations:
Universidade Federal do Rio Grande do Sul;Universidade Federal do Rio Grande do Sul
Venue:
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Year:
2005

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Abstract

As the transistor gate length goes straightforward to the sub-micron dimension, the possibilities of occurrence of external interferences in these devices also increase. Moreover, the process variability will further degrade this scenario. The direct effect of such external and/or intrinsic interferences is, in many cases, the total mismatch between the desired answer of the system and the achieved answer resulting from single bit flips. This way, new techniques must be studied in order to guarantee the correct operation of these systems. This work presents the use of a totally digital sigma-delta modulator that is used to develop arithmetic operations, which are further used to develop a FIR filter. Simulations results show that, even with the insertion of a large amount of faults, one can still obtain a non-faulty behavior in the SNR of complex application.