Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor

Authors:
Yinhe Han;Xiaowei Li;Shivakumar Swaminathan;Yu Hu;Anshuman Chandra
Affiliations:
Computing Technology, Chinese Academy of Sciences, Beijing, China;Computing Technology, Chinese Academy of Sciences, Beijing, China;IBM Microelectronics, Research Triangle Park, NC;Computing Technology, Chinese Academy of Sciences, Beijing, China;Synopsys, Inc. Mountain View, CA
Venue:
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
Year:
2005

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Abstract

This paper presents a decompression architecture using a periodically alterable MUXs decompressor for scan data volume reduction. Compared to static XOR network, the periodically alterable MUXs decompressor has multiple configurations to decode the input information more efficiently. Three different DFT techniques are proposed to handle hard, firm and soft cores, respectively. With the proposed pattern decompression algorithms and scan decompression architecture, smaller test data volume and test application time can be achieved as compared to previous techniques.