A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique
Journal of Electronic Testing: Theory and Applications
Design of asynchronous circuits for high soft error tolerance in deep submicrometer CMOS circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Designing robust threshold gates against soft errors
Microelectronics Journal
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This paper presents a systematic method for designing of a self-healing asynchronous array in the presence of errors. By adding spare resources in one of three different ways and forcing the asynchronous circuit to stall in case of failure, the specific self-reconfiguration logic is activated by a deadlock detector and the array circuit can be reconfigured around the faulty components and recover from errors automatically. Experimental evaluations show that this method requires less hardware cost, smaller critical circuit size, lower performance overhead and is more scalable than traditional NMR-based techniques.