Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis

Authors:
Erkan Acar;Sule Ozev
Affiliations:
Duke University, Durham, NC;Duke University, Durham, NC
Venue:
ITC '04 Proceedings of the International Test Conference on International Test Conference
Year:
2004

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Abstract

We present an automatic test development methodology for FM transceivers based on frequency-domain signature analysis and delayed-RF set up. We develop two distinct pass/fail criteria based on eigensignatures and envelope signatures and a test generation algorithm that aims at minimizing the required delay while attaining full coverage of target faults. We develop a fault injection and simulation platform for a VCO-modulation, low-IF transceiver architecture using MATLAB and behavioral models including non-ideal response. The proposed methodology enables the automation of the test generation process, thus reduces the test development time. Experimental results have shown a 90% reduction in the required delay thereby reducing the cost of this test hardware item.