High precision electron beam positioning using computer image analysis for electron beam testing
Microelectronic Engineering
IEEE Transactions on Pattern Analysis and Machine Intelligence
Multichannel Texture Analysis Using Localized Spatial Filters
IEEE Transactions on Pattern Analysis and Machine Intelligence
On the Localization Performance Measure and Optimal Edge Detection
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Generalized Depth Estimation Algorithm with a Single Image
IEEE Transactions on Pattern Analysis and Machine Intelligence
On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images
IEEE Transactions on Pattern Analysis and Machine Intelligence
Representing Edge Models via Local Principal Component Analysis
ECCV '02 Proceedings of the 7th European Conference on Computer Vision-Part I
Neural Edge Enhancer for Supervised Edge Enhancement from Noisy Images
IEEE Transactions on Pattern Analysis and Machine Intelligence
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This paper comments on the optimality of the Laplacian of a Gaussian edge detection filter which localizes edges through zero crossings in the filtered image. The arguments of both Marr and Hildreth, and Dickey and Shanmugam are reviewed to establish that the filter is optimal in the sense of maximizing output image energy near edge features. This filter's principal advantage over other edge detectors is that its response is user-adjustable through selection of a single parameter, the Gaussian standard deviation. However, no clear method for the selection of this parameter has been provided. The problem is addressed here by applying the filter to two ideal periodic edge models blurred by a Gaussian distribution point-spread function. The observed response to the edge spacing and blur standard deviation is then translated into a filter parameter design procedure. The problems of optimum filter performance in the presence of additive Gaussian noise are then addressed. The problem of selecting the sampled filter's coefficient word size is dealt with in a companion paper.