A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis

Authors:
Xinyue Fan;Will Moore;Camelia Hora;Mario Konijnenburg;Guido Gronthoud
Affiliations:
Oxford University, UK;Oxford University;Philips Research Labs;Philips Research Labs;Philips Research Labs
Venue:
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Year:
2006

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Abstract

The paper addresses the issue of transistor-level bridging fault diagnosis. While most of the previous bridging fault diagnosis work focuses on the gate-level bridging faults, this method provides a solution to intragate bridging faults diagnosis for the first time. Instead of using any transistor level simulation tools, we develop a transformation technique that allows transistor-level bridging faults to be diagnosed by the commonly used gate-level bridging faults diagnosis tools. Real diagnosis results from Philips designs are presented.