The Total Delay Fault Model and Statistical Delay Fault Coverage
IEEE Transactions on Computers
Statistical analysis of timing rules for high-speed synchronous VLSI systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Pin electronics IC for high speed differential devices
Proceedings of the IEEE International Test Conference 2001
500-MHz Testing on a 100-MHz Tester
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Test path simulation and characterisation
Proceedings of the IEEE International Test Conference 2001
Timing Yield Calculation Using an Impulse-train Approach
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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This paper extends the timing test model in [5] to be more realistic by including the effects of the test fixtures between a device under test and a tester. The paper enables analyzing the trade-offs that arise between the predicted yield and the required overall test environment timing accuracy (OTETA) which involves the tester overall timing accuracy (OTA) and the test fixtures' impacts. We specifically focus on the application of the extended model to predict the test yield of standard high-speed interconnects, such as PCI Express, Parallel/Serial RapidIO, and HyperTransport. The extended model reveals that achieving an actual yield of 80% with a test escape of 300 DPM (Defects Per Million) requires an equivalent OTETA that is about half the acceptable absolute limit of the tested parameter.