Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs

  • Authors:
  • Maico Cassel;Fernanda Lima Kastensmidt

  • Affiliations:
  • UFRGS, Brazil;UFRGS, Brazil

  • Venue:
  • IOLTS '06 Proceedings of the 12th IEEE International Symposium on On-Line Testing
  • Year:
  • 2006

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Abstract

This work discusses the use of two fault-tolerant techniques, duplication with self-checking and triple modular redundancy, for one-hot encoding FSM in SRAM-based techniques. The FSM encoding styles have a significant influence on the dependability of the machine in presence of bit-flips, known as Single Event Upsets (SEUs). Although the one-hot encoding style presents the best trade-off in terms of reliability, modern synthesis tools tend to optimize crucial characteristic of the one-hot style. Consequently, techniques must be applied in the hardware description language to ensure reliability of protected one-hot FSM. Results present in this paper show that fault-tolerant techniques can be easily optimized by the tools reducing the robustness of the final design. Solutions in the RTL level are proposed to ensure reliability