A Methodology for Handling Complex Functional Constraints for Large Industrial Designs
Journal of Electronic Testing: Theory and Applications
On reset based functional broadside tests
Proceedings of the Conference on Design, Automation and Test in Europe
Built-in generation of functional broadside tests using a fixed hardware structure
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper presents simulations of 3 different implementations of the minority-3 function, with special focus on mismatch analysis through statistical Monte Carlo-simulations. The simulations clearly favors the minority-3 Mirrored gate, and a gate-level ...