Processing and editing of faces using a measurement-based skin reflectance model

Authors:
Bernd Bickel;Tim Weyrich;Wojciech Matusik;Hanspeter Pfister;Craig Donner;Chien Tu;Janet McAndless;Jinho Lee;Addy Ngan;Henrik Wann Jensen;Markus Gross
Affiliations:
ETH Zürich;ETH Zürich;MERL;MERL;UCSD;MERL;MERL;MERL;MIT;UCSD;ETH Zürich
Venue:
ACM SIGGRAPH 2006 Sketches
Year:
2006

Citing 3
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Efficiently combining positions and normals for precise 3D geometry

ACM SIGGRAPH 2005 Papers

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Abstract