VLSID '95 Proceedings of the 8th International Conference on VLSI Design
An analog VLSI recurrent neural network learning a continuous-time trajectory
IEEE Transactions on Neural Networks
Toward a general-purpose analog VLSI neural network with on-chip learning
IEEE Transactions on Neural Networks
The selection of weight accuracies for Madalines
IEEE Transactions on Neural Networks
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This paper presents a unique scheme for testing and locating multiple stuck at faults in the embedded RAM modules of SRAM-based FPGAs. The RAM modules are tested using the MATS++ algorithm. The interconnection scheme makes it possible to test all the ...