The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS

  • Authors:

  • G. P. Aksenova;V. F. Khalchev

  • Affiliations:

  • Trapeznikov Institute of Control Sciences, Russian Academy of Sciences, Moscow, Russia;Trapeznikov Institute of Control Sciences, Russian Academy of Sciences, Moscow, Russia

  • Venue:
  • Automation and Remote Control
  • Year:
  • 2007

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Abstract

The application of the method of parallel-sequential built-in self-testing (PSBST) to microcircuits of the type FPGA is considered. Suggestions for the transformation of the FPGA to the control-suitable form are given and costs for this transformation are estimated. The comparison is made for the costs of the PSBST method with the known testing methods.