Fault diagnosis of a GHz CMOS LNA using high-speed ADC-based BIST

Authors:
J. Liobe;M. Margala
Affiliations:
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA;Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
Venue:
DBT '04 Proceedings of the 2004 IEEE International Workshop on Defect Based Testing
Year:
2004

Citing 0
Cited 2

Electrical characterization of analogue and RF integrated circuits by thermal measurements

Microelectronics Journal
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs

Journal of Electronic Testing: Theory and Applications

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Abstract

This paper presents a fault isolation method using the digital signatures from a LNA BIST solution. The fault localization capabilities of the functional test and data analysis methods are demonstrated by circuit level simulation. Also a discussion of the efficacy of this method is given. Results showed that only 16% of the resistive faults examined here cannot be mapped to its specification location in the LNA.