VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Built-In Test of RF Components Using Mapped Feature Extraction Sensors
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
A CMOS RF RMS Detector for Built-in Testing of Wireless Transceivers
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
Use of Embedded Sensors for Built-In-Test of RF Circuits
ITC '04 Proceedings of the International Test Conference on International Test Conference
RF Front-end System Gain and Linearity Built-in Test
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Electrical characterization of analogue and RF integrated circuits by thermal measurements
Microelectronics Journal
Fault diagnosis of a GHz CMOS LNA using high-speed ADC-based BIST
DBT '04 Proceedings of the 2004 IEEE International Workshop on Defect Based Testing
A Low-Noise Amplifier with Integrated Current and Power Sensors for RF BIST Applications
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor
Journal of Electronic Testing: Theory and Applications
| Hi-index | 0.00 |
Analog and mixed-signal testing is becoming an important issue that affects both the time-to-market and the product cost of many SoCs. In order to provide an efficient testing method for 865---870 MHz low noise amplifiers (LNAs), which constitute a mixed-signal circuit, a novel BIST method is developed. This BIST can be easily implemented with a RF peak detector and two comparators. The circuit used in the test and the LNA are designed using 0.35 µm CMOS technology. The simulation results show higher fault coverage than that of previous test methods. A total of twenty eight short and open (catastrophic) faults and eleven variation parameters have been introduced into the LNA, giving fault coverage of 100% for catastrophic faults and parametric variation. Thus, it provides an efficient structural test, which is suitable for a production test in terms of an area overhead, a test accessibility, and test time.