Electrical characterization of analogue and RF integrated circuits by thermal measurements
Microelectronics Journal
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry
Proceedings of the conference on Design, automation and test in Europe
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs
Journal of Electronic Testing: Theory and Applications
A built-in-test circuit for RF differential low noise amplifiers
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.01 |
This paper presents an ultra-fast Built in Self Test (BiST) approach for RF Low noise amplifiers. The technique uses test inputs of moderate precision and low overhead base-band circuitry to quantify various functional specifications in the LNA such as input/output match, power gain and linearity. The total self-test time for all these parameters is 15us, which is several orders of magnitude improvement over existing test techniques. The BiST circuitry described presents low real estate and power overheads and does not require the presence of DSP cores to achieve self-test. The technique has been demonstrated for a 1.9GHz cascode LNA designed in the 0.25 micron IBM 6RF process.