A Low-Noise Amplifier with Integrated Current and Power Sensors for RF BIST Applications

Authors:
Yen-Chih Huang;Hsieh-Hung Hsieh;Liang-Hung Lu
Affiliations:
National Taiwan University, Taiwan;National Taiwan University, Taiwan;National Taiwan University, Taiwan
Venue:
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Year:
2007

Citing 0
Cited 3

A general method to evaluate RF BIST techniques based on non-parametric density estimation

Proceedings of the conference on Design, automation and test in Europe
Evaluation of analog/RF test measurements at the design stage

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...