Sequential equivalence checking based on k-th invariants and circuit SAT solving

Authors:
Feng Lu;K.-T. Cheng
Affiliations:
Dept. of ECE, Univ. of California at Santa Barbara, CA, USA;Dept. of ECE, Univ. of California at Santa Barbara, CA, USA
Venue:
HLDVT '05 Proceedings of the High-Level Design Validation and Test Workshop, 2005. on Tenth IEEE International
Year:
2005

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Non-cycle-accurate sequential equivalence checking

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Sechecker: a sequential equivalence checking framework based on K th invariants

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Abstract

Deterministic functional test pattern generation has been a long-standing open problem, which is an important problem to be solved for both design verification and manufacturing testing. One key to develop a practical functional test pattern generation ...