Parameter-Variation-Aware Analysis for Noise Robustness

Authors:
Mosin Mondal;Kartik Mohanram;Yehia Massoud
Affiliations:
Rice University, USA;Rice University, USA;Rice University, USA
Venue:
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Year:
2007

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Abstract

This paper studies the impact of variability on the noise robustness of logic gates using noise rejection curves (NRCs). NRCs allow noise pulses to be modeled using magnitude-duration profiles, and can be used to derive a noise susceptibility metric for the noise robustness of logic gates. Analytical methods --based upon calibration runs in circuit simulators -- to determine noise susceptibility in the presence of variations in process, design, and environmental parameters (L_eff , V_T, V_DD, and W) are described. Such analytical methods can be used not only to accurately estimate the impact of variability on noise robustness, but also to optimize designs for noise robustness.