Accelerating Diagnosis via Dominance Relations between Sets of Faults

  • Authors:
  • Rajsekhar Adapa;Spyros Tragoudas;Maria K. Michael

  • Affiliations:
  • Southern Illinois University Carbondale, USA;Southern Illinois University Carbondale, USA;University of Cyprus

  • Venue:
  • VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
  • Year:
  • 2007

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Abstract

A new way of fault collapsing for effect-cause diagnosis is presented. In contrast to existing dominance-based-methods which operate on a pair of faults, the proposed method operates on pairs of sets of faults. The impact of the proposed method is evaluated with respect to effect-cause diagnosis. Experimental results show that the proposed collapsing methods can reduce the diagnostic simulation time on an average of 31% when compared to the existing techniques.