On reliable modular testing with vulnerable test access mechanisms
Proceedings of the 45th annual Design Automation Conference
Re-examining the use of network-on-chip as test access mechanism
Proceedings of the conference on Design, automation and test in Europe
A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms
Journal of Parallel and Distributed Computing
Test pin count reduction for NoC-based test delivery in multicore SOCs
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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This paper presents new DfT modules required to use networks-on- chip as test access mechanism. We demonstrate that the proposed DfT modules can be also implemented on top of low cost networks-on-chip, i.e. networks without complex services. The DfT modules, which consist of test wrappers and test pin interfaces, are designed such that both the tester and CUTs transport test data unaware of the network. We analyse the DfT modules in terms of silicon area and test time, considering different network and test configurations.