Improved Combinatorial Group Testing Algorithms for Real-World Problem Sizes

Authors:
David Eppstein;Michael T. Goodrich;Daniel S. Hirschberg
Affiliations:
-;-;-
Venue:
SIAM Journal on Computing
Year:
2006

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Abstract

We study practically efficient methods for performing combinatorial group testing. We present efficient nonadaptive and two-stage combinatorial group testing algorithms, which identify the at most $d$ items out of a given set of $n$ items that are defective, using fewer tests for all practical set sizes. For example, our two-stage algorithm matches the information-theoretic lower bound for the number of tests in a combinatorial group testing regimen.