Area Reliability Trade-Off in Improved Reed Muller Coding
SAMOS '08 Proceedings of the 8th international workshop on Embedded Computer Systems: Architectures, Modeling, and Simulation
Reliability aware yield improvement technique for nanotechnology based circuits
Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
Matrix codes for reliable and cost efficient memory chips
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper presents a high level method called Matrix code to protect SRAM-based memories against multiple bit upsets. The proposed method combines hamming code and parity code to assure the reliability of memory in presence of multiple bit-upsets with low area and performance overhead. The method is evaluated using one million multiple-fault injection experiments; next reliability and MTTF of the protected memories are estimated based on fault injection experiments and several equations. The fault detection/correction coverage are also calculated and compared with previous methods i.e., Reed-Muller and hamming code. The results reveal that the proposed method behaves better than these methods in terms of fault detection and correction of multiple faults regarding to the area overhead