Metastable Behavior in Digital Systems

Authors:
Lindsay Kleeman;Antonio Cantoni
Affiliations:
University of Newcastle, New South Wales;University of Newcastle, New South Wales
Venue:
IEEE Design & Test
Year:
1987

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Proceedings of the Conference on Design, Automation and Test in Europe

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Abstract

Fault-free digital circuits may malfunction when asynchronous inputs have critical timing combinations that result in metastableoperation. This mode of failure is often overlooked in digital system design and reliability analysis. Here, we survey developmentsin the study of metastable behavior and identify their relevance to digital system design and reliability, and we describeand evaluate a number of techniques for reducing the probability of metastable failure.